The LANScientific FRINGE Family Benchtop X-Ray Diffractometers (XRD) deliver fast, high-precision crystal structure and phase analysis in a compact, user-friendly design. Combining advanced XRD technology with intelligent CrystalX software, these systems provide rapid qualitative and quantitative analysis, crystallinity determination, and material characterization for powders, bulk materials, and thin films.
FRINGE Benchtop X-ray Diffractometer
Materials Science – Geology – Metallurgy – Nanotechnology – Pharmaceuticals
FRINGE CLASS Desktop XRD
Materials Science – Pharmaceuticals – Minerals – Metals – Plastics
FRINGE D200 Desktop XRD
Material Science – Geological Exploration – Pharmaceuticals – Nanotechnology
FRINGE EV Benchtop XRD
Materials Science – Building Materials – Pharmaceuticals – Nanotechnology
FRINGE EVS Desktop XRD
Materials Science – Nanotechnology – Pharmaceuticals – Geological Studies