FRINGE CLASS Benchtop X-Ray Diffractometer

FRINGE CLASS – advanced precision for material analysis.

The FRINGE CLASS desktop X-ray diffractometer, developed by LANScientific Co., LTD., is a high-performance benchtop XRD system that integrates XRD, XRF, and intelligent analysis software. Designed for rapid qualitative and quantitative analysis, it enables the characterization of crystal structures, material structure analysis, and crystallinity measurement for powders, bulk samples, and thin films.

With high precision, accuracy, stability, and wide application versatility, the FRINGE CLASS is ideal for materials research, universities, research institutes, and industrial quality control in various fields, including metals, minerals, plastics, pharmaceuticals, semiconductors, and building materials.

Key Features of the FRINGE CLASS XRD

  • Patented θ-2θ Coupling Linkage Goniometer
    The single-axis drive mechanism ensures precise, stable, and reliable diffraction measurements.

  • Integrated DPPC Detector
    Digital multi-channel analysis distinguishes diffraction peaks from fluorescence interference without the need for a monochromator, thereby enhancing diffraction intensity and accuracy.

  • CrystalX Automated Software
    One-click operation automatically performs phase analysis and calculates component percentages, making XRD simple and accessible.

  • Air-Spring Lift Door & Space-Saving Design
    Large window door optimizes desktop space and usability.

  • Built-In Water Circulation Cooling
    Eliminates the need for an external chiller, with real-time monitoring of X-ray tube temperature, flow, and rate.

  • Integrated Sola Slits
    No moving parts enhance the reliability of the goniometer and allow for installation in mobile or in-vehicle laboratory setups.

  • Enhanced Safety
    Automatic cut-off, interlocking devices, and a fully enclosed sample chamber ensure safe operation.

Applications

The FRINGE CLASS is ideal for phase identification, crystal structure analysis, material characterization, and crystallinity measurement across various fields, including materials science, pharmaceuticals, minerals, metals, plastics, and semiconductor research.