LabStation-5 – high-performance modular XRD for advanced material analysis.

The LabStation-5 X-ray diffractometer is a next-generation, multifunctional desktop XRD system designed for high-precision, fully automated diffraction analysis. Equipped with a high-performance HPC photon-counting detector and integrated CrystalX intelligent analysis software, LabStation-5 offers one-click operation from sample placement to result analysis, significantly streamlining experiments and enhancing research efficiency.

Key Features of LabStation-5 XRD

• Modular Design
  Flexible, tool-free snap-in sample stages enable quick installation and replacement, accommodating diverse configurations to meet various research needs.

• Multiple Beam Geometries
  Switch seamlessly between Bragg-Brentano geometry for powders and parallel beam geometry for bulk materials, thin films, coatings, and complex samples—including amorphous, polycrystalline, and epitaxial materials.

• HPC Photon-Counting Detector
  Delivers superior diffraction intensity, sensitivity, signal-to-noise ratio, dynamic range, time resolution, and spatial resolution, enabling precise analysis across a wide range of sample types.

• Motorized Variable Slits
  Automatically adjusts slit width to optimize beam intensity and resolution, improving accuracy and efficiency across different sample conditions.

• Diverse Accessory Options
  Supports a wide array of sample stages and measurement configurations for powders, liquids, fibers, sheets, thin films, and more.

• Extended Diffraction Circle & Non-Coplanar Arm
  A diffraction circle radius of≥300mm, combined with a non-coplanar arm structure, expands the measurable angular range, enhances in-plane diffraction capability, and improves accuracy for thin films, nanomaterials, polycrystalline materials, residual stress, and texture analysis.

Applications

LabStation-5 is ideal for materials science, nanotechnology, pharmaceuticals, semiconductors, coatings, and advanced research, providing high-precision phase analysis, crystal structure determination, residual stress measurement, and texture analysis for powders, bulk materials, thin films, and complex samples.