Fast, Accurate, and Reliable XRF Coatings Analysis
The Hitachi FT110A benchtop XRF analyzer is purpose-built for high-throughput coating thickness measurement and plating quality control in production environments. Combining powerful X-ray fluorescence (XRF) technology with automated sample positioning, the FT110A boosts productivity in plating shops and manufacturing facilities while ensuring every component meets industry standards.
Engineered for precision and speed, the FT110A provides non-destructive testing, enabling safe, reliable inspection of finished goods. With the ability to analyze up to four layers plus the substrate and bath solutions, it delivers accurate results in seconds. The updated imaging system, large sample stage, and intuitive software interface make it easy for both skilled and non-specialist operators to use, reducing human error and increasing efficiency.
FT110A Product Highlights
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High-speed XRF measurement for maximum productivity
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Non-destructive analysis – safe for plated and finished components
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Measures up to four layers plus substrate and bath solution
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Automated sample positioning for consistent, repeatable results
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Powerful imaging system and large chamber for versatile sample handling
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Easy-to-use interface ideal for operators of all skill levels
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Complies with international standards: ISO 3497, ASTM B568, DIN 50987
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Customizable configurations to meet specific coating analysis applications
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Designed for 24/7 production environments with robust, reliable operation
Why Choose the Hitachi FT110A XRF Analyzer?
The FT110A is the ideal solution for plating shops, manufacturers, and quality control labs that need fast, repeatable, and precise XRF coating analysis. It streamlines your workflow, supports continuous operation, and ensures compliance with global coating standards — helping you maintain quality assurance while reducing downtime and rework.

