Simply Smarter XRF Technology
The Hitachi FT230 benchtop XRF analyzer is engineered to deliver rapid, accurate, and automated coating thickness measurement and material analysis. Designed for maximum productivity, the FT230 drastically reduces analysis time by automating sample setup and measurement recipe selection. This next-generation analyzer uses innovative recognition software to streamline workflows, enabling 100% inspection in demanding production environments.
Thanks to Hitachi’s Find My Part™ and automated focusing technology, operators load the sample and confirm the part — the FT230 XRF analyzer automatically identifies the correct measurement locations, selects the appropriate analysis program, and seamlessly sends results to your quality management system. This means fewer errors, faster throughput, and greater consistency in every measurement.
FT230 Product Highlights
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Automated focusing for reduced sample setup time
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Find My Part™ intelligent recognition automatically configures the whole measurement routine.
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Large sample viewing area for optimal visibility and control
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Self-checking diagnostics ensure long-term instrument stability and reliability
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Seamless software integration for smooth data transfer and analysis
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User-friendly interface designed for both specialists and non-specialists
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Powerful multilayer capability – measures up to four layers plus the substrate
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Rugged, durable design for use in both laboratory and production environments
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Standards compliance: ASTM B568, DIN ISO 3497
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Industry applications: ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554), and immersion Ag (IPC-4553A)
Why Choose the FT230 Analyzer?
The FT230 is ideal for electronics manufacturing, plating quality control, and materials verification, offering the speed and automation required for modern production. By reducing human error and optimizing every step of the measurement process, the FT230 allows your team to achieve greater efficiency, traceability, and precision with every analysis.