FRINGE C1600 – your reliable partner for phase analysis and crystal structure characterization.

The FRINGE C1600 desktop X-ray diffractometer is a multifunctional XRD analyzer designed for rapid, precise, and versatile material analysis. Using X-ray diffraction technology, it captures diffraction patterns to determine the material composition, crystal structure, crystallinity, grain size, lattice parameters, and both macroscopic and microscopic stresses.

Ideal for materials science, biomedicine, minerals, plastics, and semiconductor research, the FRINGE C1600 handles powders, bulk samples, and thin films with accuracy, stability, and efficiency.

Key Features of the FRINGE C1600 XRD

• θ-2θ Linkage Goniometer System
  Patented single-axis drive ensures high precision, smooth operation, and reliable diffraction measurement.

• Multi-channel DPPC Detector
  Digital multi-channel analysis technology enables the distinction of diffraction peaks from fluorescence interference, eliminating the need for a monochromator and thereby enhancing diffraction intensity and data quality.

• CrystalX Automated Software
  One-click operation for phase analysis, quantitative component determination, and crystallinity evaluation—making XRD accessible for all users.

• Integrated Sola Slits
  No moving parts enhance goniometer reliability, enabling its use in both stationary labs and mobile/in-vehicle laboratory platforms.

• Comprehensive Safety
  Automatic cut-off, interlocking devices, and a fully enclosed sample chamber ensure safe operation at all times.

Applications

The FRINGE C1600 is perfect for phase identification, crystal structure analysis, material characterization, and stress measurement in research and industrial environments, including academic labs, pharmaceuticals, metallurgy, and electronics.